X-ışını difraktometresi (XRD)PANalytical
X’Pert PRO MPD
X-ışını difraktometresi (XRD)
PANalytical
X’Pert PRO MPD
Sabit fiyat KDV dahil değil
€13.500
Koşul
Kullanılan
Konum
Borken 

Resimleri göster
Haritayı göster
Makineye ait bilgiler
Fiyat ve Konum
Sabit fiyat KDV dahil değil
€13.500
- Konum:
- Einsteinstraße 8a, 46325 Borken, Deutschland

Çağrı
Teklif detayları
- Liste kimliği:
- A195-31791
- Referans No.:
- 24688
- Son güncelleme tarihi:
- 10.07.2025
Açıklama
PANalytical X’Pert PRO MPD X-ray Diffractometer (XRD)
Excerpt from Service Report:
Device: PANalytical X’Pert PRO MPD
Date: 07.07.2021
Work carried out:
- Reinstallation and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete alignment of the goniometer and other components
- Maintenance, including replacement of defective parts
Spare parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
FAN FOR X-CELERATOR UNIT FAN
FILTER FILTER, WATER
Motor PW3050
("Device was not tested in our facility")
The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) for structural characterization of crystalline materials. It is ideal for pure research as well as for routine applications in industry and university environments. Its modular design, rapid detection, and temperature and atmosphere control make it suitable for both standard analyses and complex in-situ experiments.
Key features:
Different measuring geometries possible:
- Reflection in Bragg-Brentano (θ–2θ) mode
- Transmission geometry for powders in capillaries
- Optional: SAXS (Small-Angle X-ray Scattering) for nanostructure analysis
Radiation source and detectors:
- Typically copper anode (Cu-Kα, λ ≈ 1.54 Å)
- X’Celerator detector (1D, ultra-fast) for parallel data acquisition
Modular system with PreFIX technology:
- Quick changes of optics and sample stages without recalibration
In-situ measurements at high temperatures:
- Measurements possible up to approx. 1200°C
- Controlled atmosphere: air, nitrogen, oxygen (reducing atmosphere limited)
Typical applications:
- Phase analysis and quantitative Rietveld refinement
- Determination of crystallite size, microstrain, residual stress
- In-situ studies of phase transitions, oxidation, crystallization, etc.
- SAXS measurements for analysis of nanoparticles and pore structures
- Wide range of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and more
Technical specifications (typical):
Property & Specification
Angle range (2θ): approx. 0.5° to 150°
Step size: up to 0.002° or finer
Goniometer: vertical, 0–0, radius approx. 240 mm
Temperature range: room temperature up to approx. 1200°C
Bwedpfewycatox Almol
Atmosphere: air, N₂, O₂ (reducing atmosphere limited)
Detectors: X’Celerator (1D), proportional counter
Distribution & application sites:
The X’Pert PRO MPD is in use worldwide, e.g. at:
Universities (ETH Zurich, TU Dresden, University of Vienna)
Research institutes (e.g. Max Planck Institutes, ICN2, IS2M)
Industry (e.g. materials development, pharmaceutical, chemical)
Condition: used
Scope of delivery: (see image)
(Subject to change and errors in technical specifications. All information without guarantee!)
If you have further questions, we are happy to answer them by phone.
Bu ilan otomatik olarak tercüme edildiğinden bazı çeviri hataları oluşmuş olabilir.
Excerpt from Service Report:
Device: PANalytical X’Pert PRO MPD
Date: 07.07.2021
Work carried out:
- Reinstallation and commissioning of the system
- Connection of external supply lines
- Warm-up phase
- Complete alignment of the goniometer and other components
- Maintenance, including replacement of defective parts
Spare parts used:
L 3.6V NC/U3 R15.0X52.0 BATTERY. NI-CD
FAN FOR X-CELERATOR UNIT FAN
FILTER FILTER, WATER
Motor PW3050
("Device was not tested in our facility")
The X’Pert PRO MPD is a highly versatile and powerful X-ray diffractometer (XRD) for structural characterization of crystalline materials. It is ideal for pure research as well as for routine applications in industry and university environments. Its modular design, rapid detection, and temperature and atmosphere control make it suitable for both standard analyses and complex in-situ experiments.
Key features:
Different measuring geometries possible:
- Reflection in Bragg-Brentano (θ–2θ) mode
- Transmission geometry for powders in capillaries
- Optional: SAXS (Small-Angle X-ray Scattering) for nanostructure analysis
Radiation source and detectors:
- Typically copper anode (Cu-Kα, λ ≈ 1.54 Å)
- X’Celerator detector (1D, ultra-fast) for parallel data acquisition
Modular system with PreFIX technology:
- Quick changes of optics and sample stages without recalibration
In-situ measurements at high temperatures:
- Measurements possible up to approx. 1200°C
- Controlled atmosphere: air, nitrogen, oxygen (reducing atmosphere limited)
Typical applications:
- Phase analysis and quantitative Rietveld refinement
- Determination of crystallite size, microstrain, residual stress
- In-situ studies of phase transitions, oxidation, crystallization, etc.
- SAXS measurements for analysis of nanoparticles and pore structures
- Wide range of sample types: powders, thin films, ceramics, pharmaceuticals, catalysts, and more
Technical specifications (typical):
Property & Specification
Angle range (2θ): approx. 0.5° to 150°
Step size: up to 0.002° or finer
Goniometer: vertical, 0–0, radius approx. 240 mm
Temperature range: room temperature up to approx. 1200°C
Bwedpfewycatox Almol
Atmosphere: air, N₂, O₂ (reducing atmosphere limited)
Detectors: X’Celerator (1D), proportional counter
Distribution & application sites:
The X’Pert PRO MPD is in use worldwide, e.g. at:
Universities (ETH Zurich, TU Dresden, University of Vienna)
Research institutes (e.g. Max Planck Institutes, ICN2, IS2M)
Industry (e.g. materials development, pharmaceutical, chemical)
Condition: used
Scope of delivery: (see image)
(Subject to change and errors in technical specifications. All information without guarantee!)
If you have further questions, we are happy to answer them by phone.
Bu ilan otomatik olarak tercüme edildiğinden bazı çeviri hataları oluşmuş olabilir.
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