Bilgisayar Kontrollü Taramalı Elektron Mikroskobu (PC-SEM)

Jeol JSM-6490 Bruker XFlash Detektor

Type: Jeol JSM-6490
Jeol JSM-6490 Scanning Electron Microscope (PC-SEM)
Modern, high-resolution, digital scanning electron microscope featuring newly developed electron optics and an intuitive graphical user interface (GUI) operating under Microsoft Windows XP Professional.

Equipment configuration and key features:
- Magnification range: 5x – 300,000x
- Acceleration voltage: 0.3 – 30 kV
- Tungsten filament cathode (LaB6 cathode optional)
- Large fully-motorized specimen stage with eccentric tilt, including:
- Graphical navigation on the specimen holder
- Easy specimen navigation via click-center-zoom
- Field-of-view controlled navigation using 2 navigators
- Relative coordinate navigation
- Saving and recalling specimen positions
- Adjustable image area selection for the stage
- Image field correction during rotation via computer-controlled eccentric rotation
- Image field correction during tilt via computer-controlled eccentric tilt
- Calculation of permissible tilt angle based on specimen geometry
- Auto focus tracking during Z-axis movements
- Intelligent limit switches for motorized axes
- Specimen stage travel range: x = 125 mm, y = 100 mm, z = 5–80 mm (stepless), T = -10°C to +90°C, R = 360° (continuous)
- Secondary electron detector for high vacuum operation
- Newly designed super-conical objective lens ensures maximum image resolution even at high tilt angles
- Guaranteed resolution in SE imaging: 3 nm at 30 kV, 15 nm at 1 kV
- Simultaneous live image display from multiple detectors
- Powerful image measurement functionalities
- Movie mode for recording dynamic processes
- Versatile specimen chamber with multiple upgrade options: open ports for EDX, WDX, EBSD, cathodoluminescence, etc.
- Maintenance-free, low-wear, quiet pump system consisting of a fore-vacuum pump, vibration-free high-performance diffusion pump, and electromagnetic valve control
- Comprehensive error protection against operator errors and external media failures
- Ergonomic, height-adjustable system table
- SEM starter kit including 2 specimen holders, tool kit, and 6 spare cathodes

Additional equipment for Scanning Electron Microscope:
- Turbomolecular pump (in place of standard diffusion pump)
- When using a turbomolecular pump, no cooling water is required for SEM operation.

Further SEM equipment:
- PC for SEM control incl. TFT monitor
- OX200 Bruker Quantax 200 EDX System EXTENDED
- Bruker EDX software license will be transferred to the new owner after purchase!
- Nitrogen-free energy-dispersive X-ray analysis system including:
- SDD detector with 127 eV or better energy resolution
- Detection of all elements from boron upwards
- Vibration-free, maintenance-free, Peltier-cooled (nitrogen-free)
- Pulse processor
- TFT monitor
- Spectrum measurement and element identification
- Fully-automatic, quantitative, standardless element analysis
- Image acquisition
- Ultra-fast qualitative line scan
- Ultra-fast qualitative element mapping
- Data management and archiving system
- Report generation and result output
Laedpfxszd Ufaj Apyoc
- Data communication
- Installation and training
- HyperMap
- Multipoint analysis
- Bruker xFlash detector (SDD) with signal processing unit SVE III

Scope of delivery: (See photos)
Condition: used
(Technical data subject to change and errors excepted!)

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